• DocumentCode
    3470520
  • Title

    State analysis: an alternative approach to FMEA, FTA and Markov analysis

  • Author

    Ruiz, Israel ; Paniagua, Enrique ; Albert, Joaquin ; Sanabria, Juli

  • Author_Institution
    Hewlett-Packard, Barcelona, Spain
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    370
  • Lastpage
    375
  • Abstract
    State analysis is an alternative functional approach to any other failure analysis technique that tries to face with current product and process design requirements. While other methodologies discover failures without a complete system understanding, state analysis focuses on finding system level failure modes by means of building a full functional model. State analysis grades failure modes in a more representative way by means of applying a customer reaction model, of combining factors, of following fuzzy rules and of including uncertainties. In this way, you are able to focus on important issues and produce field failure rate estimates with these results. Applying state analysis, a total of 635 issues have been identified in 12 sessions, of 2 hours, with an average of 7 people per session. An FMEA of a function was done with different people involved in order to compare. The results were: double time investment, 8 people involved and no critical subsystem interaction issues detected. State analysis has been found an intuitive, comprehensive and easy tool to analyze product functions, failures and design weaknesses within the IPD (integrated product design) environment
  • Keywords
    failure analysis; product development; reliability; failure analysis technique; failure modes grading; field failure rate estimates; full functional model; fuzzy rules; integrated product design; product design weaknesses analysis; product failures analysis; product functions analysis; state analysis; system level failure modes; Artificial intelligence; Buildings; Documentation; Failure analysis; Fault trees; Investments; Process design; Product design; US Department of Transportation; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 2000. Proceedings. Annual
  • Conference_Location
    Los Angeles, CA
  • ISSN
    0149-144X
  • Print_ISBN
    0-7803-5848-1
  • Type

    conf

  • DOI
    10.1109/RAMS.2000.816336
  • Filename
    816336