DocumentCode :
3470708
Title :
A sub-micron-gap soi capacitive accelerometer array utilizing size effect
Author :
Matsui, Y. ; Hirai, Y. ; Tsuchiya, T. ; Tabata, O.
Author_Institution :
Dept. of Micro Eng., Kyoto Univ., Kyoto, Japan
fYear :
2015
fDate :
21-25 June 2015
Firstpage :
2212
Lastpage :
2215
Abstract :
This paper reports a 10×10 arrayed single-axis accelerometer, whose unit size is 1/10 of conventional accelerometers. From the theoretical calculation, we can increase sensitivity per sensing area volume by 10 times when decreasing all dimensions by 1/10. The negative resist pattern with a sub-õm gap was obtained by electron beam lithography. The reliability (stiction and pull-in) issue, which was more apparent on miniaturizing, was solved by a nonlinear programming method in the design. In this research in-plane size effect was demonstrated by a 10×10 array of 80-õm-square unit accelerometers that have the 0.5-õm gap in the sensing capacitance. The measured sensitivity is 0.99 fF/g, which is the same as that of conventional 3-õm gap accelerometers.
Keywords :
accelerometers; capacitance measurement; capacitive sensors; electron beam lithography; elemental semiconductors; nonlinear programming; reliability; resists; sensor arrays; silicon; silicon-on-insulator; size effect; Si; capacitance sensor; electron beam lithography; in-plane size effect; negative resist pattern; nonlinear programming method; reliability; single-axis accelerometer; submicron-gap SOI capacitive accelerometer array; Accelerometers; Arrays; Capacitance; Electrodes; Resonant frequency; Sensitivity; Sensors; SOI; capacitive accelerometer; pull-in; sub-õm gap;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS), 2015 Transducers - 2015 18th International Conference on
Conference_Location :
Anchorage, AK
Type :
conf
DOI :
10.1109/TRANSDUCERS.2015.7181400
Filename :
7181400
Link To Document :
بازگشت