DocumentCode
3470709
Title
High-speed KTN optical beam deflector for swept-source optical coherence tomography
Author
Sasaki, Yutaka ; Okabe, Yasuo ; Ueno, Masahiro ; Sakamoto, Takanori ; Toyoda, Seiji ; Kobayashi, Junya ; Yagi, S. ; Naganuma, K.
Author_Institution
NTT Photonics Labs., NTT Corp., Atsugi, Japan
fYear
2013
fDate
11-13 Nov. 2013
Firstpage
1
Lastpage
4
Abstract
We have developed an electro-optic (EO) optical beam deflector using KTa1-xNbxO3 (KTN) crystal. The combination of the huge second order EO (Kerr) effect of KTN crystal and control of the electron injection into the crystal makes the deflection angle appreciable. We describe the operation principle for this fast and large angle deflection. We also describe the packaging of the KTN deflector and beam shaping lenses at the high-frequency deflection. We built swept light sources equipped with a KTN deflector for optical coherence tomography (OCT). With OCT, an imaging technique using laser interferometry, it is possible to obtain depth-resolved information about biological tissue with micrometer-scale spatial resolution. A 200-kHz scan rate was obtained with a 20-mW average output power at a scan range exceeding 100 nm. The coherence length measured by using the relative signal decay from a different path delay is 7 mm. We obtained OCT images of biological tissue using our swept light source OCT system.
Keywords
biological tissues; biomedical optical imaging; electro-optical deflectors; lenses; light interferometry; optical Kerr effect; optical materials; optical pulse shaping; optical tomography; potassium compounds; tantalum compounds; KTa1-xNbxO3; Kerr effect; OCT; beam shaping lenses; biological tissue; coherence length; deflection angle; depth-resolved information; electron injection; electrooptic optical beam deflector; frequency 200 kHz; high-speed KTN optical beam deflector; huge second order EO effect; laser interferometry; light sources; micrometer-scale spatial resolution; path delay; relative signal decay; swept-source optical coherence tomography; Coherence; Crystals; Electrooptic deflectors; Lenses; Light sources; Optical beams; Optical interferometry; EO deflector; KTN; OCT;
fLanguage
English
Publisher
ieee
Conference_Titel
CPMT Symposium Japan (ICSJ), 2013 IEEE 3rd
Conference_Location
Kyoto
Print_ISBN
978-1-4799-2718-0
Type
conf
DOI
10.1109/ICSJ.2013.6756100
Filename
6756100
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