• DocumentCode
    3470891
  • Title

    Direct modeling of scintillator thickness for optimal light output and spatial resolution

  • Author

    Mitchell, Stephen E. ; Luttman, Aaron ; Fowler, M. ; Joyce, K.T.

  • Author_Institution
    Nat. Security Technol., LLC, Las Vegas, NV, USA
  • fYear
    2013
  • fDate
    16-21 June 2013
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    It is common in x-ray radiography to use scintillators (e.g., BGO or LSO) to convert x-rays to visible light, which is then recorded by an imaging system. The response of the scintillator depends fundamentally on its thickness, with respect to both its visible light emittance and its spatial resolution. This is important for optimizing light output, signal to noise ratio, or optical response time. Given that it is often cost-prohibitive to procure a variety of scintillator samples and empirically test the performance, it is essential to be able to model and accurately simulate the performance of a scintillator with respect to thickness and other properties, and a direct way of doing this is using Monte Carlo-based radiation transport codes. Such simulations can be expensive in terms of computational time, and the codes are not easily obtained. In this work we first show such simulations, and demonstrate that there is a natural trade-off between light output of a scintillator and its spatial resolution. We then derive a first-principles model that accurately approximates the light output, using straightforward calculations that can be performed quickly with any basic computing software. We compare the results to those obtained from Monte Carlo simulations and show that our simplified model can be used to analyze the tradeoff between emittance and resolution nearly as well as using a full-scale radiation transport code.
  • Keywords
    Monte Carlo methods; X-ray imaging; scintillation counters; Monte Carlo based radiation transport code; X-ray radiography; first principle model; imaging system; optimal light output; scintillator thickness; spatial resolution; Analytical models; Approximation methods; Computational modeling; Crystals; Monte Carlo methods; Photonics; Spatial resolution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulsed Power Conference (PPC), 2013 19th IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    2158-4915
  • Type

    conf

  • DOI
    10.1109/PPC.2013.6627699
  • Filename
    6627699