• DocumentCode
    3471104
  • Title

    Development of mjtcs on fused silica substrates at nist

  • Author

    Lipe, T.E. ; Kinard, J.R. ; Scarioni, L.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    95
  • Lastpage
    96
  • Abstract
    We are developing a new generation of thin-film multijunction thermal converters based on fused silica substrates for ac voltage measurements at frequencies up to 100 MHz and for ac current measurements at frequencies up to 1 MHz. Fused silica has been selected over the previous crystalline quartz material because it is significantly more robust that crystalline quartz, yet retains excellent dielectric properties. We report on the design and fabrication of the new fused silica chips, including a novel method for forming thin membranes, and present results for two designs as both ac voltage and current converters.
  • Keywords
    electric current measurement; quartz; substrates; voltage measurement; MJTCS development; NIST; ac current measurement; ac voltage measurement; crystalline quartz material; current converters; dielectric properties; fused silica chips; fused silica substrates; multijunction thermal converters; thin-film multijunction thermal converters; AC generators; Crystalline materials; Crystallization; Current measurement; Dielectric substrates; Frequency conversion; NIST; Silicon compounds; Transistors; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements (CPEM), 2010 Conference on
  • Conference_Location
    Daejeon
  • Print_ISBN
    978-1-4244-6795-2
  • Type

    conf

  • DOI
    10.1109/CPEM.2010.5543945
  • Filename
    5543945