• DocumentCode
    3471115
  • Title

    Improvement of chemical resistance of positive-tone photosensitive polyimide coatings in the electroless plating process

  • Author

    Baba, Osamu ; Kamemoto, Satoshi ; Masuda, Y. ; Yuba, T. ; Tomikawa, Morimasa

  • Author_Institution
    Electron. & Imaging Mater. Res. Labs, Toray Ind., Inc., Otsu, Japan
  • fYear
    2013
  • fDate
    11-13 Nov. 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    We found that positive-tone photosensitive polyimide (posi-PSPI) shows not to be compatible for electroless Ni/Au plating process which are used for Au micro bumping. In order to meet compatibility for the process, we improved chemical resistance of positive-tone photosensitive polyimide especially for electroless plating process. Changing of polyimide polymer structure is most effective to obtain chemical resistant for the electroless plating process. The obtained PSPI are useful for saving bumping process and reliable in forming pattern.
  • Keywords
    electroless deposited coatings; gold; nickel; polymers; semiconductor technology; Ni-Au; bumping process; chemical resistance; electroless plating process; forming pattern; polyimide polymer structure; positive-tone photosensitive polyimide coatings; Chemicals; Gold; Nickel; Polyimides; Resistance; Substrates; electroless plating process; good chemical resistance; polyimides;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    CPMT Symposium Japan (ICSJ), 2013 IEEE 3rd
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-1-4799-2718-0
  • Type

    conf

  • DOI
    10.1109/ICSJ.2013.6756123
  • Filename
    6756123