DocumentCode
3471115
Title
Improvement of chemical resistance of positive-tone photosensitive polyimide coatings in the electroless plating process
Author
Baba, Osamu ; Kamemoto, Satoshi ; Masuda, Y. ; Yuba, T. ; Tomikawa, Morimasa
Author_Institution
Electron. & Imaging Mater. Res. Labs, Toray Ind., Inc., Otsu, Japan
fYear
2013
fDate
11-13 Nov. 2013
Firstpage
1
Lastpage
4
Abstract
We found that positive-tone photosensitive polyimide (posi-PSPI) shows not to be compatible for electroless Ni/Au plating process which are used for Au micro bumping. In order to meet compatibility for the process, we improved chemical resistance of positive-tone photosensitive polyimide especially for electroless plating process. Changing of polyimide polymer structure is most effective to obtain chemical resistant for the electroless plating process. The obtained PSPI are useful for saving bumping process and reliable in forming pattern.
Keywords
electroless deposited coatings; gold; nickel; polymers; semiconductor technology; Ni-Au; bumping process; chemical resistance; electroless plating process; forming pattern; polyimide polymer structure; positive-tone photosensitive polyimide coatings; Chemicals; Gold; Nickel; Polyimides; Resistance; Substrates; electroless plating process; good chemical resistance; polyimides;
fLanguage
English
Publisher
ieee
Conference_Titel
CPMT Symposium Japan (ICSJ), 2013 IEEE 3rd
Conference_Location
Kyoto
Print_ISBN
978-1-4799-2718-0
Type
conf
DOI
10.1109/ICSJ.2013.6756123
Filename
6756123
Link To Document