Title :
Built-in IDDT appearance time sensor for detecting open faults in 3D IC
Author :
Suenaga, Shunichiro ; Hashizume, Masaki ; Yotsuyanagi, Hiroyuki ; Tada, Tetsuya ; Shyue-Kung Lu
Author_Institution :
Inst. of Tech. & Sci., Univ. of Tokushima, Tokushima, Japan
Abstract :
A built-in sensor is proposed for detecting open faults in a 3D IC by means of appearance time of dynamic supply current. It is shown by Spice simulation that they can be detected with the sensor.
Keywords :
built-in self test; circuit simulation; fault simulation; three-dimensional integrated circuits; 3D IC; SPICE simulation; built-in IDDT appearance time sensor; dynamic supply current; open fault detection; CMOS integrated circuits; Circuit faults; Delays; Logic gates; Testing; Three-dimensional displays; 3D IC; BIST; IDDT testing;
Conference_Titel :
CPMT Symposium Japan (ICSJ), 2013 IEEE 3rd
Conference_Location :
Kyoto
Print_ISBN :
978-1-4799-2718-0
DOI :
10.1109/ICSJ.2013.6756127
