• DocumentCode
    3472406
  • Title

    Software reliability growth process-a life cycle approach

  • Author

    Raheja, Dev G.

  • Author_Institution
    Technol. Manage. Inc., Laurel, MD, USA
  • fYear
    1989
  • fDate
    24-26 Jan 1989
  • Firstpage
    52
  • Lastpage
    55
  • Abstract
    The author presents a life-cycle cost-reduction technique to achieve rapid growth rate in software reliability growth. He points out the deficiencies in the current practices in the hardware reliability growth process and how to overcome such weaknesses in software engineering. It is suggested that fixing errors in software introduces a negative growth because the programmer may not know which paths are affected by the change. The best way to accelerate the software reliability and maintenance growth is to identify engineering changes in the early design phases. The ATAF program tends to minimize risks and lower life-cycle costs significantly
  • Keywords
    software reliability; ATAF program; cost-reduction technique; life cycle; rapid growth rate; software engineering; software reliability; Computer bugs; Costs; Failure analysis; Hardware; Performance analysis; Radar; Rain; Software reliability; Technology management; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 1989. Proceedings., Annual
  • Conference_Location
    Atlanta, GA
  • Type

    conf

  • DOI
    10.1109/ARMS.1989.49573
  • Filename
    49573