DocumentCode
3472406
Title
Software reliability growth process-a life cycle approach
Author
Raheja, Dev G.
Author_Institution
Technol. Manage. Inc., Laurel, MD, USA
fYear
1989
fDate
24-26 Jan 1989
Firstpage
52
Lastpage
55
Abstract
The author presents a life-cycle cost-reduction technique to achieve rapid growth rate in software reliability growth. He points out the deficiencies in the current practices in the hardware reliability growth process and how to overcome such weaknesses in software engineering. It is suggested that fixing errors in software introduces a negative growth because the programmer may not know which paths are affected by the change. The best way to accelerate the software reliability and maintenance growth is to identify engineering changes in the early design phases. The ATAF program tends to minimize risks and lower life-cycle costs significantly
Keywords
software reliability; ATAF program; cost-reduction technique; life cycle; rapid growth rate; software engineering; software reliability; Computer bugs; Costs; Failure analysis; Hardware; Performance analysis; Radar; Rain; Software reliability; Technology management; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 1989. Proceedings., Annual
Conference_Location
Atlanta, GA
Type
conf
DOI
10.1109/ARMS.1989.49573
Filename
49573
Link To Document