• DocumentCode
    3472469
  • Title

    Applying patent analysis to explore the co-opetition behavior between two led manufacturers — Nichia and Osram

  • Author

    Chen, Yu-Shan ; Chen, Bi-Yu

  • Author_Institution
    Dept. of Bus. Adm., Nat. Yunlin Univ. of Sci. & Technol., Douliou, Taiwan
  • fYear
    2009
  • fDate
    2-6 Aug. 2009
  • Firstpage
    1447
  • Lastpage
    1455
  • Abstract
    This study used patent analysis to explore the co-opetition behavior between the two LED manufactures, Nichia and Osram, from the two critical technological fields in the LED industry, LED components and phosphor. The results of patent analysis indicated that Nichia had advantages in the field of LED components, while Osram had advantages in the field of phosphor. Therefore, there existed cooperation opportunities for the two opponents in the LED industry, because their technological capabilities were partially complementary. Therefore, Nichia and Osram were willing to make a compromise to solve the patent litigations between them and further agreed to offer cross-licensing of patents for each other. Their strategic reactions were changed from full competition to co-opetition which is win-win for them. The results of this study can provide a valuable reference for managers not only in considering patent strategies of their companies, but also in formulating strategic plans.
  • Keywords
    light emitting diodes; patents; phosphors; LED component; LED manufacturer; Nichia; Osram; coopetition behavior; cross-licensing; patent analysis; phosphor; Coatings; Gallium nitride; III-V semiconductor materials; Indium; Light emitting diodes; Manufacturing; Mass production; Phosphorescence; Phosphors; Research and development;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Management of Engineering & Technology, 2009. PICMET 2009. Portland International Conference on
  • Conference_Location
    Portland, OR
  • Print_ISBN
    978-1-890843-20-5
  • Electronic_ISBN
    978-1-890843-20-5
  • Type

    conf

  • DOI
    10.1109/PICMET.2009.5261975
  • Filename
    5261975