• DocumentCode
    3472536
  • Title

    The importance and challenges of comprehending circuit and physical phenomena in RF system design and integration

  • Author

    Spoto, James ; Chrisikos, George ; Heimlich, Michael ; Maas, Steve

  • Author_Institution
    Appl. Wave Res., El Segundo, CA
  • fYear
    2006
  • fDate
    23-26 Oct. 2006
  • Firstpage
    1825
  • Lastpage
    1828
  • Abstract
    This paper addresses the challenges associated with RF system design and verification in the presence of detailed circuit-level impairments and physical implementation parasitics. Distortion, compression, noise, memory effects, as well as a number of other non-ideal effects, can dramatically degrade system performance. Many of these effects are difficult and expensive to extract and model at the system level. Once these RF systems are physically implemented, signals across the chip through the package and board are distorted and delayed by interconnect parasitics. In addition, disparate platforms for RF system, circuit, IC, and package/PCB design and verification limit the designer´s ability to deal concurrently with these effects across these domains. Poor tool integration and the inability to take these effects into consideration early in the design cycle are responsible for a large number of expensive product development re-spins and delays. Solutions to some of these challenges are emerging and will be discussed. Other challenges are still only understood as proposed research topics. Ideas for their potential resolution will be presented herein as well
  • Keywords
    electronics packaging; network synthesis; product development; RF system design; circuit-level impairments; comprehending circuit; product development; tool integration; Circuit noise; Degradation; Delay; Distortion; Integrated circuit interconnections; Packaging; RF signals; Radio frequency; Radiofrequency integrated circuits; System performance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-0160-7
  • Electronic_ISBN
    1-4244-0161-5
  • Type

    conf

  • DOI
    10.1109/ICSICT.2006.306458
  • Filename
    4098554