DocumentCode
3472545
Title
Microtomography at the ESRF beamline ID 22
Author
Weitkamp, T. ; Rau, C. ; Snigirev, A. ; Drakopoulos, M. ; Simionovici, A.
Author_Institution
Eur. Synchrotron Radiat. Facility, Grenoble, France
Volume
3
fYear
2000
fDate
2000
Abstract
Summary form only given. We present the microtomography setup at the ESRF microfluorescence, imaging and diffraction beamline ID 22, including recent results and technical developments. The coherence properties of the high-energy (10 to 70 keV) X-ray undulator beam at ID 22 make the setup especially suited for phase-contrast tomography including possible holographic reconstruction. A fast-readout, low-noise CCD camera makes time-resolved imaging possible. Recent developments in magnifying X-ray optics such as compound refractive lenses and Fresnel zone plates open up the field of magnified-X-ray imaging with a resolution of less than 300 nm. The combination of scanning microprobe techniques such as microfluorescence and microdiffraction with full-field imaging and tomography allows the acquisition of complementary data on morphology, chemistry and crystal structure of a sample. Imaging techniques using a “pink beam”, i.e., a beam with limited monochromaticity obtained by filtering one harmonic from the undulator spectrum, can increase flux in intensity-limited experiments
Keywords
X-ray imaging; X-ray optics; coherence; lenses; synchrotron radiation; tomography; undulator radiation; wigglers; zone plates; 10 to 70 eV; ESRF beamline ID 22; Fresnel zone plates; coherence properties; compound refractive lenses; fast-readout low-noise CCD; full-field imaging; high-energy X-ray undulator beam; holographic reconstruction; limited monochromaticity beam; magnified-X-ray imaging; magnifying X-ray optics; microdiffraction; microfluorescence; microtomography setup; phase-contrast tomography; pink beam; scanning microprobe techniques; time-resolved imaging; Charge coupled devices; Charge-coupled image sensors; Holography; Image reconstruction; Optical imaging; Optical refraction; Tomography; Undulators; X-ray diffraction; X-ray imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2000 IEEE
Conference_Location
Lyon
ISSN
1082-3654
Print_ISBN
0-7803-6503-8
Type
conf
DOI
10.1109/NSSMIC.2000.949263
Filename
949263
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