Title :
Challenges for RF SOC in nanometer technology
Author_Institution :
UMC Corp., Sunnyvale, CA
Abstract :
This paper discusses the challenges, and issues that RF SOC facing regarding architecture, manufacture and design. To meet the challenge, silicon foundries have to provide more beyond design kits and manufacture services. The close cooperative of advanced semiconductor technology, design service, and advances in electronic design automation (EDA) becomes the solution for the new era. It is shown that novel improvements to the foundry design kits and utilization of advanced electromagnetic and circuit simulation is the key to first-pass silicon success
Keywords :
circuit simulation; electronic design automation; semiconductor technology; system-on-chip; RF SOC; advanced semiconductor technology; circuit simulation; electromagnetic simulation; electronic design automation; nanometer technology; Circuits; Computer architecture; Cost function; Electronic design automation and methodology; Foundries; Packaging; Radio frequency; Semiconductor device manufacture; Silicon; Testing;
Conference_Titel :
Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0160-7
Electronic_ISBN :
1-4244-0161-5
DOI :
10.1109/ICSICT.2006.306459