Title :
Power characterization of LFSRs
Author :
Brazzarola, Marco ; Fummi, Franco
Author_Institution :
Dipt. di Inf., Univ. di Verona, Italy
Abstract :
This paper presents a formal analysis on the power consumption of BIST architectures composed of primitive-polynomial LFSRs connected to a combinational CUT. An exact power characterization of all primitive-polynomial LFSRs has been identified, since interesting invariant properties have been discovered
Keywords :
built-in self test; integrated circuit testing; logic testing; shift registers; BIST architectures; LFSR characterisation; formal analysis; invariant properties; linear feedback shift registers; power characterization; power consumption; primitive-polynomial LFSR; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Electrical fault detection; Energy consumption; Fault detection; Logic circuits; Logic devices; Polynomials;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1999. DFT '99. International Symposium on
Conference_Location :
Albuquerque, NM
Print_ISBN :
0-7695-0325-x
DOI :
10.1109/DFTVS.1999.802879
