• DocumentCode
    3472970
  • Title

    Integrating local feature and global statistics for texture analysis

  • Author

    Xu, Yong ; Huang, SiBin ; Ji, Hui

  • Author_Institution
    Sch. of Comput. Sci. & Eng., South China Univ. of Technol., Guangzhou, China
  • fYear
    2009
  • fDate
    7-10 Nov. 2009
  • Firstpage
    1377
  • Lastpage
    1380
  • Abstract
    A main challenge for texture analysis is to construct a compact texture descriptor which is not only highly discriminative to intra-class textures, but also robust to inter-class variations, geometric and photometric changes. In this paper, a new texture descriptor is developed by integrating the local affine-invariant texture features and the global viewpoint-invariant statistics. Based on the pixel clustering using two state-of-art robust local texture descriptors (i.e. SIFT and SPIN), the proposed texture descriptor enables impressive invariance to a wide range of environmental changes (e.g. view changes, illumination changes, surface distortions) by characterizing the spatial distribution of pixel sets using multi-fractal analysis. Experiments on some real datasets (publicly available) showed that the proposed texture descriptor achieved better performance than some state-of-art techniques in texture retrieval and texture classification while the computation cost is significantly reduced.
  • Keywords
    affine transforms; feature extraction; fractals; image classification; image texture; statistical analysis; compact texture descriptor; geometric change; global viewpoint-invariant statistics; local affine-invariant texture features; multifractal analysis; photometric change; pixel clustering; texture analysis; texture classification; texture retrieval; Fractals; Histograms; Image texture analysis; Information retrieval; Lighting; Pixel; Robustness; Shape; Statistical analysis; Surface texture; Image texture analysis; feature extraction; image classification; image recognition; pattern recognition;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2009 16th IEEE International Conference on
  • Conference_Location
    Cairo
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-5653-6
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2009.5413361
  • Filename
    5413361