DocumentCode
3473556
Title
Artificial vision for automated manufacturing systems in communications industry
Author
Marino, Perfecto ; Dominguez, Miguel Angel
Author_Institution
Dept. of Electron. Technol., Vigo Univ., Spain
fYear
1997
fDate
9-12 Sep 1997
Firstpage
421
Lastpage
426
Abstract
The authors have been involved in the implementation of a total quality control project in a communications equipment company, whose products are mounted and tested in a manufacturing plant controlled by an IBM Token Ring LAN. The most significant products are RF and microwave amplifier boards for satellite TV receivers, with electronic components based on SMT technology. The first implementation of total quality control project was an automatic test equipment (ATE) LAN node that runs a program of verification for single-channel and multichannel electronic amplifiers. This ATE LAN node is supported in its performance for a RF analyzer connected to it through an IEEE 488 bus. The next implementation is an automated inspection LAN node to detect the missing of SMT and non-SMT components mounted in the electronic cards of above mentioned amplifiers. This LAN node for automated inspection is based an artificial vision called MVI (Machine-Vision Inspection)
Keywords
automatic optical inspection; automatic test equipment; computer vision; electronics industry; flexible manufacturing systems; printed circuit manufacture; quality control; surface mount technology; ATE LAN node; FMS; IBM Token Ring LAN; PCB; RF amplifier boards; SMT technology; automated manufacturing systems; automated optical inspection; communications industry; machine-vision; microwave amplifier boards; total quality control; Communication equipment; Electronic equipment manufacture; Inspection; Local area networks; Manufacturing systems; Quality control; Radio frequency; Radiofrequency amplifiers; Surface-mount technology; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Emerging Technologies and Factory Automation Proceedings, 1997. ETFA '97., 1997 6th International Conference on
Conference_Location
Los Angeles, CA
Print_ISBN
0-7803-4192-9
Type
conf
DOI
10.1109/ETFA.1997.616307
Filename
616307
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