DocumentCode :
3473586
Title :
Intelligent Integrated Control Method in Manufacturing Process
Author :
Musheng, Yang ; Yu, Zhang
Author_Institution :
Shandong Univ. of Technol., Zibo
fYear :
2007
fDate :
18-21 Aug. 2007
Firstpage :
1640
Lastpage :
1645
Abstract :
EPC and SPC play a different role in manufacturing process quality control, EPC method can properly control single parameter´s changes during the manufacturing process to meet quality requirements, SPC can predicts and control stability of manufacturing process and discovers the control state of manufacturing process as soon as possible. Therefore, using the SPC and EPC integrated control technology can better ensure the quality of the products. This paper outlines the features of the SPC and EPC method during the manufacturing quality control, putting forward a process control system which integrates the EPC and SPC method and studies the informational interface technique, the intelligent integration technique and the harmonious control technique for the two method, and then analyzes the integrated technique and the quality guaranteed technique for the two method through a specific manufacturing process example. The application of this technique not only guarantees the needs of the individual parameter, but also the distribution regulation of the group of a same parameter.
Keywords :
intelligent control; manufacturing processes; quality control; stability; statistical process control; engineering process control; harmonious control technique; informational interface technique; intelligent integrated control method; manufacturing process quality control; stability; statistical process control; Centralized control; Control systems; Intelligent control; Logic circuits; Logic devices; Maintenance engineering; Manufacturing processes; Process control; Quality control; Voltage control; engineering process control; intelligent integration; quality control; statistical process control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Automation and Logistics, 2007 IEEE International Conference on
Conference_Location :
Jinan
Print_ISBN :
978-1-4244-1531-1
Type :
conf
DOI :
10.1109/ICAL.2007.4338835
Filename :
4338835
Link To Document :
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