• DocumentCode
    3473638
  • Title

    Improving reliability by modifying system configuration

  • Author

    Younes, M.A. ; Khalil, A.M. ; Hassan, D.M.

  • Author_Institution
    Production Eng. Dept., Alexandria Univ., Alexandria, Egypt
  • fYear
    2011
  • fDate
    14-17 Sept. 2011
  • Firstpage
    450
  • Lastpage
    454
  • Abstract
    This paper investigates how to improve system reliability by modifying the configuration of its components to realize a robust design. The methodology is applied on the voltage regulator of an electronic circuit with a +5volts regulated power supply. The effect of three different design modifications on the overall system reliability has been investigated, series redundancy, parallel redundancy and parallel-series redundancy. A single factor linear regression with median rank model is used to evaluate the reliability of the three suggested designs. The inverse power law model is used to characterize the relationship between system lifetime (L) and stress (voltage) level (V). Parallel-series design showed the best results regarding system reliability. The average Time-to-Failure at 25 volts stress level for the parallel-series design was found to be 3.5 times that of the initial design, 2.5 times that of the series design and 2.17 times that of the parallel design.
  • Keywords
    circuit reliability; circuit testing; network synthesis; power supply circuits; regression analysis; voltage regulators; components configuration; design modifications; electronic circuit; inverse power law model; parallel-series redundancy; regulated power supply; reliability improvement; single factor linear regression; system lifetime; time-to-failure; voltage 25 V; voltage regulator; Life estimation; Redundancy; Regulators; Reliability engineering; Stress; Voltage control; Reliability improvement; accelerated life test; component redundancy; robust design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality and Reliability (ICQR), 2011 IEEE International Conference on
  • Conference_Location
    Bangkok
  • Print_ISBN
    978-1-4577-0626-4
  • Type

    conf

  • DOI
    10.1109/ICQR.2011.6031759
  • Filename
    6031759