DocumentCode
3473681
Title
A robust test sequence for XOR trees
Author
Tao, D.L. ; Hartmann, C.R.P. ; Lala, P.K.
Author_Institution
SUNY at Stony Brook
Volume
2
fYear
1989
fDate
1989
Firstpage
994
Lastpage
998
Keywords
Application software; Circuit faults; Circuit testing; Digital arithmetic; Electrical fault detection; Fault detection; Information science; Logic testing; Robustness; Semiconductor device modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Signals, Systems and Computers, 1989. Twenty-Third Asilomar Conference on
Print_ISBN
0-929029-30-1
Type
conf
DOI
10.1109/ACSSC.1989.1201047
Filename
1201047
Link To Document