DocumentCode :
3473939
Title :
New opportunities with the open architecture test system
Author :
Rajsuman, R.
Author_Institution :
Advantest America R&D Center
fYear :
2004
fDate :
27-30 Jan. 2004
Firstpage :
335
Lastpage :
335
Abstract :
The general view of the Open Architecture test system is shown in Figure 1. It is a distributed object environment under Microsoft Windows operating system. The test system itself has been defined as a modularized system with a module control software and a backplane communication library. The definition of modules includes digital modules, device power-supply (DPS) module, arbitrary waveform generator (AWG) module, digitizer module etc. An open backplane communication library accessed via C++ language based test program and a GUI test programming layer above C++ provides a generalized user??s interface for the test system.
Keywords :
Backplanes; Computer architecture; Costs; Educational institutions; Electronic equipment testing; Manufacturing; Research and development; Semiconductor device testing; Software libraries; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2004. Proceedings of the ASP-DAC 2004. Asia and South Pacific
Conference_Location :
Yohohama, Japan
Print_ISBN :
0-7803-8175-0
Type :
conf
DOI :
10.1109/ASPDAC.2004.1337592
Filename :
1337592
Link To Document :
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