DocumentCode
3474152
Title
Enhancing the ability of Ensemble Empirical Mode Decomposition in machine fault diagnosis
Author
Guo, Wei ; Tse, Peter W.
Author_Institution
Dept. of Manuf. Eng. & Eng. Manage., City Univ. of Hong Kong, Kowloon Tong, China
fYear
2010
fDate
12-14 Jan. 2010
Firstpage
1
Lastpage
7
Abstract
Empirical mode decomposition (EMD) is an adaptive time-frequency analysis method that has been widely employing for machinery fault diagnosis. EMD is famous in revealing instantaneous change of frequency or time from non-linear sensory signal so that the occurrence of anomalous signal can be accurately detected. However, its shortcomings include mode mixing and end effects that often appear in its decomposed bands. These problems decrease the accuracy, particularly in vibration-based fault diagnosis. Recently, many researchers have proposed various improved methods, which include the famous Ensemble EMD (EEMD), to solve the problem of mode mixing. Its purpose is to introduce controlled amount of white noise to the original EMD. After adding known white noise into the raw signal, the signal in the band will have a uniformly distributed reference scale which forces the EEMD to exhaust all possible solutions in the sifting process for minimizing mode mixing effect. Even though EEMD becomes popular, the proper settings for the number of ensemble and the amplitude of white noise that should be added are still not formally prescribed. This paper discusses the influence of parameters setting on the results of reducing mode mixing problem. Tests were done using both simulated and real machine signals. Their results provide a guideline on setting the parameters properly so that the ability of EEMD on machine fault diagnosis can be significantly enhanced.
Keywords
fault diagnosis; machinery; maintenance engineering; time-frequency analysis; vibrations; white noise; adaptive time-frequency analysis; ensemble empirical mode decomposition; machine fault diagnosis; mode mixing effect; vibration-based fault diagnosis; white noise; Asset management; Electric breakdown; Fault diagnosis; Laboratories; Manufacturing; Signal analysis; Signal processing; Time frequency analysis; Wavelet analysis; Wavelet packets;
fLanguage
English
Publisher
ieee
Conference_Titel
Prognostics and Health Management Conference, 2010. PHM '10.
Conference_Location
Macao
Print_ISBN
978-1-4244-4756-5
Electronic_ISBN
978-1-4244-4758-9
Type
conf
DOI
10.1109/PHM.2010.5413421
Filename
5413421
Link To Document