DocumentCode
3474530
Title
A novel and simple pulsed dc bias test system for power amplifier
Author
Zhang Jian ; Li Ling-yun ; Gu Jian-zhong ; He Wei ; Sun Xiao-Wei
Author_Institution
Shanghai Inst. of Microsyst. & Inf. Technol., Chinese Acad. of Sci., Shanghai
fYear
2006
fDate
23-26 Oct. 2006
Firstpage
2142
Lastpage
2144
Abstract
A novel and simple pulse Dc bias test system has been established to emulate an isothermal environment for on-wafer characterization of MMIC power amplifiers. Testing results of a Ka band monolithic power amplifier with pulse dc bias show a power output capacity increase of 1.5-2dBm at the frequency of 33GHz
Keywords
MMIC power amplifiers; integrated circuit testing; 33 GHz; Ka band; MMIC power amplifiers; pulsed DC bias test; Circuit testing; High power amplifiers; MOSFET circuits; Power MOSFET; Power amplifiers; Power measurement; Probes; Pulse amplifiers; Pulse measurements; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
Conference_Location
Shanghai
Print_ISBN
1-4244-0160-7
Electronic_ISBN
1-4244-0161-5
Type
conf
DOI
10.1109/ICSICT.2006.306663
Filename
4098650
Link To Document