Title :
A New LFSR Reseeding Method for BIST
Author :
Yan, Yong-zhi ; Wang, Hong ; Yang, Zhi-jia ; Yang, Song
Author_Institution :
Shenyang Inst. of Autom., Chinese Acad. of Sci., Shenyang
Abstract :
This paper presents a new BIST reseeding method that can significantly increase the ratio of test data compression using one LFSR seed to encode multiple deterministic test patterns. Experimental results on ISCAS89 benchmark circuits show that this method has about 30% reduction of the seed number
Keywords :
built-in self test; data compression; shift registers; BIST; LFSR reseeding; built-in self test; linear feedback shift register; test data compression; Automatic test pattern generation; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Encoding; Equations; Flip-flops; Test data compression; Test pattern generators;
Conference_Titel :
Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0160-7
Electronic_ISBN :
1-4244-0161-5
DOI :
10.1109/ICSICT.2006.306664
