DocumentCode :
3474585
Title :
Key Algorithms for Accurate GSM EDGE EVM Measurement on ATE Platform
Author :
Xia, Shu ; Chen, Helen ; Xu, Zhe ; Hong, Crystal
Author_Institution :
Applications Dev. Center, Teradyne Co. Ltd., Shanghai
fYear :
2006
fDate :
23-26 Oct. 2006
Firstpage :
2151
Lastpage :
2154
Abstract :
There´s a high demand for accurate, fast, yet easy to implement GSM EDGE EVM algorithm in final production test on ATE platforms. This paper proposes two key algorithms, one for symbol timing recovery, and the other for frequency offset correction. The symbol timing recovery algorithm is based upon constructing the eye diagram on the interpolated EDGE signal and finding the minimum magnitude variance among different sample positions. The frequency offset correction algorithm is realized by brutal demodulation of the EDGE signal, followed by a correction of plusmnpi/4 phase discontinuity, and a linear regression to de-embed frequency offset from the phase noise. Test programs using these algorithms show good correlation with bench equipment when testing a real transceiver device
Keywords :
3G mobile communication; automatic test equipment; cellular radio; modulation; phase noise; radio receivers; synchronisation; transceivers; 8-PSK; ATE platform; EDGE signal demodulation; GSM EDGE EVM algorithm; RF transceiver; eye diagram; final production test; frequency offset correction; interpolated EDGE signal; minimum magnitude variance; modulation accuracy; phase noise; symbol timing recovery; transceiver device testing; Demodulation; Frequency; GSM; Linear regression; Phase noise; Production; Signal analysis; Testing; Timing; Transceivers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0160-7
Electronic_ISBN :
1-4244-0161-5
Type :
conf
DOI :
10.1109/ICSICT.2006.306666
Filename :
4098653
Link To Document :
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