DocumentCode :
3474686
Title :
Properties of thin layers of Sn62Pb36Ag2
Author :
Grossmann, Günter ; Weher, L. ; Heiduschke, Klaus
Author_Institution :
Reliability Lab., Swiss Federal Inst. of Technol., Zurich, Switzerland
fYear :
1995
fDate :
2-4 Oct 1995
Firstpage :
502
Lastpage :
507
Abstract :
The increasing miniaturisation of surface mount devices(SMD) reveals some new questions concerning the reliability of solder joints. The components become larger and the solder joints smaller. Especially the thickness mainly influences the mean lifetime of surface mount technology (SMT) solder joints, where micro-fracture and damage evolve under thermomechanical cycling. When the electrical power is switched on and off, the solder joints are heavily distorted due to the thermal expansion mismatch of the package and the PCB. The deformation in eutectic Sn-Pb at homologous temperatures close to 1 is known to be strongly related to grain- and phase boundary mechanisms. Therefore, a change of the mechanical behaviour is expected, if the phase size is of the order of the thickness of the solder layer. This paper covers the determination of the deformation behaviour of thin layers, down to 25 μm
Keywords :
deformation; grain boundaries; lead alloys; metallic thin films; silver alloys; soldering; surface mount technology; thermal expansion; tin alloys; 25 micron; SMD soldering; SMT solder joints; Sn-Pb-Ag; Sn62Pb36Ag2; deformation behaviour; grain boundary mechanisms; mean lifetime; mechanical behaviour; microfracture; phase boundary mechanisms; reliability; surface mount devices; thermal expansion mismatch; thermomechanical cycling; thin layers; Capacitive sensors; Circuit testing; Joining materials; Lead; Packaging; Phase change materials; Printed circuits; Soldering; Surface-mount technology; Temperature; Temperature distribution; Thermal expansion; Thermomechanical processes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1995. 'Manufacturing Technologies - Present and Future', Seventeenth IEEE/CPMT International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-2996-1
Type :
conf
DOI :
10.1109/IEMT.1995.526211
Filename :
526211
Link To Document :
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