DocumentCode
3474692
Title
An Improved Heuristic Algorithm for MCM Substrate Test
Author
Dong, Gang ; Xu, Ru-Qing ; Huang, Wei-Wei ; Yang, Yin-tang
Author_Institution
Inst. of Microelectron., Xidian Univ.
fYear
2006
fDate
23-26 Oct. 2006
Firstpage
2161
Lastpage
2163
Abstract
An improved heuristic algorithm for finding the optimal traversal route of a single probe to test MCM interconnects is presented in this paper. Heuristic algorithm is firstly used to get an initial result for the optimization problem, and then simulated annealing algorithm is used to improve the result dramatically. Simulation shows that the new novel heuristic algorithm is effective to solve single probe routing optimization problem
Keywords
integrated circuit interconnections; integrated circuit testing; multichip modules; network routing; simulated annealing; MCM interconnects; heuristic algorithm; multichip modules; optimal traversal route; routing optimization; simulated annealing; Costs; Equations; Heuristic algorithms; Materials testing; Probes; Routing; Semiconductor device packaging; Semiconductor device testing; Simulated annealing; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
Conference_Location
Shanghai
Print_ISBN
1-4244-0160-7
Electronic_ISBN
1-4244-0161-5
Type
conf
DOI
10.1109/ICSICT.2006.306669
Filename
4098656
Link To Document