• DocumentCode
    3474857
  • Title

    Total dose induced bias current variation in the LM124 operational amplifier with Different Bias

  • Author

    Liu Jian-Bo ; Liu Yuan ; En Yun-Fei ; Yang Yuan-Zheng ; He Yu-Juan ; Shi Qian

  • Author_Institution
    Guangdong Univ. of Technol., Guangzhou, China
  • fYear
    2013
  • fDate
    3-5 June 2013
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Total dose dependence of bias current in the linear operational amplifier LM124 with different bias are presented. The experimental results show that the bias currents in the LM124 with powered bias are significant affected by oxide trapped charges; furthermore, the bias currents in the low dose rate are more affected by the interface state near Si/SiO2. These results can be used for design and hardness assurance.
  • Keywords
    interface states; operational amplifiers; radiation hardening (electronics); LM124 operational amplifier; Si-SiO2; interface state; linear operational amplifier; low dose rate; oxide trapped charges; total dose induced bias current variation; bias current; fixed charge; interface state; operational amplifier; total dose;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Solid-State Circuits (EDSSC), 2013 IEEE International Conference of
  • Conference_Location
    Hong Kong
  • Type

    conf

  • DOI
    10.1109/EDSSC.2013.6628049
  • Filename
    6628049
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3474857