• DocumentCode
    3475009
  • Title

    A V/sub DD/ and temperature independent CMOS voltage reference circuit

  • Author

    Matsuda, T. ; Minami, R. ; Kanamori, A. ; Iwata, H. ; Ohzone, T. ; Yamamoto, S. ; Ihara, T. ; Nakajima, S.

  • Author_Institution
    Toyama Prefectural University
  • fYear
    2004
  • fDate
    27-30 Jan. 2004
  • Firstpage
    559
  • Lastpage
    560
  • Abstract
    A pure CMOS threshold voltage reference (VTR)circuit achieves temperature(T) coefficient of 5 μV/°C (T=60~+100 °C) and supply voltage(VDD) sensitivity of O.1 mV/V (VDD=3-5 V). The combination of subthreshold current characteristics and different operating modes in n-MOSFETs provides a small voltage and temperature dependence. A feedback scheme from the reference output to gates of n-MOSFETs not only stabilizes the output but also saves the die area.
  • Keywords
    CMOS process; Circuit testing; Low voltage; MOSFET circuits; Resistors; Solid state circuits; Temperature; Threshold voltage; Very large scale integration; Video recording;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2004. Proceedings of the ASP-DAC 2004. Asia and South Pacific
  • Conference_Location
    Yohohama, Japan
  • Print_ISBN
    0-7803-8175-0
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2004.1337648
  • Filename
    1337648
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3475009