DocumentCode :
3475009
Title :
A V/sub DD/ and temperature independent CMOS voltage reference circuit
Author :
Matsuda, T. ; Minami, R. ; Kanamori, A. ; Iwata, H. ; Ohzone, T. ; Yamamoto, S. ; Ihara, T. ; Nakajima, S.
Author_Institution :
Toyama Prefectural University
fYear :
2004
fDate :
27-30 Jan. 2004
Firstpage :
559
Lastpage :
560
Abstract :
A pure CMOS threshold voltage reference (VTR)circuit achieves temperature(T) coefficient of 5 μV/°C (T=60~+100 °C) and supply voltage(VDD) sensitivity of O.1 mV/V (VDD=3-5 V). The combination of subthreshold current characteristics and different operating modes in n-MOSFETs provides a small voltage and temperature dependence. A feedback scheme from the reference output to gates of n-MOSFETs not only stabilizes the output but also saves the die area.
Keywords :
CMOS process; Circuit testing; Low voltage; MOSFET circuits; Resistors; Solid state circuits; Temperature; Threshold voltage; Very large scale integration; Video recording;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2004. Proceedings of the ASP-DAC 2004. Asia and South Pacific
Conference_Location :
Yohohama, Japan
Print_ISBN :
0-7803-8175-0
Type :
conf
DOI :
10.1109/ASPDAC.2004.1337648
Filename :
1337648
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3475009
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