DocumentCode
3475085
Title
Timing measurement unit with multi-stage TVC for embedded memories
Author
Kae-Jiun Mo ; Shao-Sheng Yang ; Tsin-Yuan Chang
Author_Institution
National Tsing-Hua University
fYear
2004
fDate
27-30 Jan. 2004
Firstpage
565
Lastpage
566
Abstract
To find the maximum access time for embedded memories, a wide range and scalable time-to-digital converter (TDC) composed of multi-stage time-to-voltage converter (TVC), peak voltage detector, voltage-to-time converter (VTC) and ring counter is present. Four-stage TVC is applied in the TDC to measure the time intervals of 3ns to 160ns and 500ps resolution with external clock 50MHz. After calibration, the measured maximum error and linearity error are one LSB and 0.625%, respectively.
Keywords
Clocks; Counting circuits; Detectors; Integrated circuit measurements; Measurement units; Semiconductor device measurement; Testing; Time measurement; Timing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2004. Proceedings of the ASP-DAC 2004. Asia and South Pacific
Conference_Location
Yohohama, Japan
Print_ISBN
0-7803-8175-0
Type
conf
DOI
10.1109/ASPDAC.2004.1337651
Filename
1337651
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