Title :
National metrology standards for scattering parameter calibration at radio frequency
Author :
Horibe, Masahiro ; Shida, Masaaki ; Komiyama, Koji
Author_Institution :
Nat. Metrol. Inst. of Japan, Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan
Abstract :
This paper summarizes a load device used as the NMIJ´s primary standards for S-parameter calibrations at radio frequencies. The characteristics of the primary load device were calculated on the basis of microwave transmission line theory after SI traceable measurements of dimensions and resistance / insertion loss of whole parts of the load device. The load device keeps its characteristics for a long time, i.e. approximately within 0.00035 deviation par four months. The expanded uncertainty of approximately 0.001 was achieved at 10 MHz for reflection coefficient of the load device.
Keywords :
S-parameters; calibration; transmission line theory; S-parameter calibrations; SI traceable measurements; frequency 10 MHz; insertion loss; microwave transmission line theory; national metrology standards; primary load device; radio frequency; reflection coefficient; scattering parameter calibration; Calibration; Electrical resistance measurement; Metrology; Microwave devices; Microwave measurements; Microwave theory and techniques; Radio frequency; Scattering parameters; Transmission line measurements; Transmission line theory;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-6795-2
DOI :
10.1109/CPEM.2010.5544186