• DocumentCode
    3475115
  • Title

    National metrology standards for scattering parameter calibration at radio frequency

  • Author

    Horibe, Masahiro ; Shida, Masaaki ; Komiyama, Koji

  • Author_Institution
    Nat. Metrol. Inst. of Japan, Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    700
  • Lastpage
    701
  • Abstract
    This paper summarizes a load device used as the NMIJ´s primary standards for S-parameter calibrations at radio frequencies. The characteristics of the primary load device were calculated on the basis of microwave transmission line theory after SI traceable measurements of dimensions and resistance / insertion loss of whole parts of the load device. The load device keeps its characteristics for a long time, i.e. approximately within 0.00035 deviation par four months. The expanded uncertainty of approximately 0.001 was achieved at 10 MHz for reflection coefficient of the load device.
  • Keywords
    S-parameters; calibration; transmission line theory; S-parameter calibrations; SI traceable measurements; frequency 10 MHz; insertion loss; microwave transmission line theory; national metrology standards; primary load device; radio frequency; reflection coefficient; scattering parameter calibration; Calibration; Electrical resistance measurement; Metrology; Microwave devices; Microwave measurements; Microwave theory and techniques; Radio frequency; Scattering parameters; Transmission line measurements; Transmission line theory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements (CPEM), 2010 Conference on
  • Conference_Location
    Daejeon
  • Print_ISBN
    978-1-4244-6795-2
  • Type

    conf

  • DOI
    10.1109/CPEM.2010.5544186
  • Filename
    5544186