Process variability influence on complementary organic circuits characterictics

This paper presents a study on the variability of N- and P-type organic transistors fabrication process and its consequences on organic circuits´ electrical performance. Model cards corresponding to the measured devices are carried out and permit to simulate organic circuits. A NAND gate, made of four transistors, is simulated, manufactured and electrically characterized. Even though an important dispersion among the transistors electrical characteristics is observed, all measured NAND gates are functional.