Title :
Non-destructive broadband material characterization over the K-band using whispering-gallery-mode resonators
Author :
Kheir, Mohamed S. ; Hammad, Hany F. ; Omar, Abbas
Author_Institution :
Fac. of Inf. Eng. & Technol., German Univ. in Cairo, Cairo, Egypt
Abstract :
A precise technique for broadband material characterization, using a whispering-gallery-mode (WGM) resonator, is proposed. The resonant perturbation method is successfully applied for extracting both the dielectric constant and loss tangent of materials over a wide frequency band. Two experimental prototypes are fabricated and employed over the K-band where consistent results are obtained with a maximum error of ±3.3%.
Keywords :
dielectric materials; dielectric resonators; microwave materials; K-band; dielectric materials; nondestructive broadband material characterization; resonant perturbation method; whispering-gallery-mode resonators; Dielectric constant; Dielectric losses; Dielectric materials; Dielectric measurements; Electromagnetic waveguides; K-band; Performance evaluation; Prototypes; Resonance; Resonant frequency;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-6795-2
DOI :
10.1109/CPEM.2010.5544214
