• DocumentCode
    3475793
  • Title

    Impact of Monitoring Voltage on the Lifetime Extrapolation During the Accelerated Degradation Tests

  • Author

    Duan, Franklin ; Cooper, Stephen ; Marathe, Amit ; Zhang, John ; Jayanarayanan, Sankaran Kartik

  • Author_Institution
    AMD, Sunnyvale, CA
  • fYear
    2006
  • fDate
    Oct. 16 2006-Sept. 19 2006
  • Firstpage
    139
  • Lastpage
    141
  • Abstract
    During the accelerated stressing test, not only the stress voltage affects the lifetime extrapolation but also the monitoring voltage plays a considerable role. We have conducted a series of tests in various stress and monitoring voltages to quantify this impact. We have seen ~20 times difference on lifetime at monitoring voltages of 1.0V and 1.5V under a same stressed voltage. This difference should be taken into account to accurately predict the lifetime at normal use conditions from the data obtained in accelerated life test
  • Keywords
    extrapolation; life testing; stress effects; 1 V; 1.5 V; accelerated degradation tests; accelerated stressing test; lifetime extrapolation; monitoring voltage; stress voltage affects; CMOS technology; Circuit testing; Degradation; Extrapolation; Human computer interaction; Life estimation; Life testing; Monitoring; Stress; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop Final Report, 2006 IEEE International
  • Conference_Location
    South Lake Tahoe, CA
  • ISSN
    1930-8841
  • Print_ISBN
    1-4244-0296-4
  • Electronic_ISBN
    1930-8841
  • Type

    conf

  • DOI
    10.1109/IRWS.2006.305229
  • Filename
    4098706