DocumentCode :
3475793
Title :
Impact of Monitoring Voltage on the Lifetime Extrapolation During the Accelerated Degradation Tests
Author :
Duan, Franklin ; Cooper, Stephen ; Marathe, Amit ; Zhang, John ; Jayanarayanan, Sankaran Kartik
Author_Institution :
AMD, Sunnyvale, CA
fYear :
2006
fDate :
Oct. 16 2006-Sept. 19 2006
Firstpage :
139
Lastpage :
141
Abstract :
During the accelerated stressing test, not only the stress voltage affects the lifetime extrapolation but also the monitoring voltage plays a considerable role. We have conducted a series of tests in various stress and monitoring voltages to quantify this impact. We have seen ~20 times difference on lifetime at monitoring voltages of 1.0V and 1.5V under a same stressed voltage. This difference should be taken into account to accurately predict the lifetime at normal use conditions from the data obtained in accelerated life test
Keywords :
extrapolation; life testing; stress effects; 1 V; 1.5 V; accelerated degradation tests; accelerated stressing test; lifetime extrapolation; monitoring voltage; stress voltage affects; CMOS technology; Circuit testing; Degradation; Extrapolation; Human computer interaction; Life estimation; Life testing; Monitoring; Stress; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Reliability Workshop Final Report, 2006 IEEE International
Conference_Location :
South Lake Tahoe, CA
ISSN :
1930-8841
Print_ISBN :
1-4244-0296-4
Electronic_ISBN :
1930-8841
Type :
conf
DOI :
10.1109/IRWS.2006.305229
Filename :
4098706
Link To Document :
بازگشت