Title : 
Key management in wireless ad hoc networks: collusion analysis and prevention
         
        
            Author : 
Younis, Mohamed ; Ghumman, KajaIdeep ; Eltoweissy, Mohamed
         
        
            Author_Institution : 
Dept. of Comput. Sci. & Elect. Eng., Maryland Univ., Baltimore, MD, USA
         
        
        
        
        
        
            Abstract : 
Due to the dynamic nature of wireless ad-hoc networks (WAHNs) and the multi-node involvement in most WAHN applications, group key management has been proposed for efficient support of secure communications. Exclusion basis systems (EBS) provide a framework for scalable and efficient group key management where the number of keys per node and the number of re-key messages can be relatively adjusted. EBS-based solutions, however, may suffer from collusion attacks, where a number of nodes may collaborate to reveal all system keys and consequently capture the network. In this paper we investigate the collusion problem in EBS and demonstrate that a careful assignment of keys to nodes reduces collusion. Since an optimal assignment is NP hard, we propose a location-based heuristic where keys are assigned to neighboring nodes depending on the Hamming distance between the strings of bits representing the used subset of the keys.
         
        
            Keywords : 
ad hoc networks; authorisation; cryptography; telecommunication congestion control; telecommunication network management; telecommunication network reliability; telecommunication security; EBS; Hamming distance; WAHN; collusion attack; exclusion basis system; group key management; scalability; secure communication; wireless ad-hoc network; Ad hoc networks; Application software; Business; Computer network management; Computer science; Cryptography; Data security; Information security; Intelligent networks; Military computing;
         
        
        
        
            Conference_Titel : 
Performance, Computing, and Communications Conference, 2005. IPCCC 2005. 24th IEEE International
         
        
        
            Print_ISBN : 
0-7803-8991-3
         
        
        
            DOI : 
10.1109/PCCC.2005.1460553