DocumentCode :
3476281
Title :
AI-ESTATE model editing in a component based ATS
Author :
Giarla, A.J. ; Meech, Duncan
fYear :
2001
fDate :
2001
Firstpage :
679
Lastpage :
690
Abstract :
"All Test Environments" that are based on the IEEE 1232 Standard, that is, are AI-ESTATE compliant, utilize diagnostic information models as specified by the 1232 Standard. Thus the creation and maintenance of these models are critical to the operation of the Test Environment. This paper details a Model Editing Component (MEC) that operates as a plug-n-play component in a component based ATS architecture. The diagnostic information model is represented within the Standard in the EXPRESS language. Due to empirical assessments of test engineering human factors the editor hides this representation from the test engineer. The model editor instead presents the information model in a combination of well-understood graphical forms and data dialogs while providing functional operations through well-understood drag-n-drop and click operations. The important information model relationships are handled automatically behind the graphical representation layer relieving the test engineer from learning and maintaining an understanding of the EXPRESS language. Also discussed are the morphological and topological display algorithms as well as operational usage, model storage/retrieval management, import/export, exchange and maturation
Keywords :
IEEE standards; automatic test software; diagnostic expert systems; diagnostic reasoning; distributed object management; electronic data interchange; fault trees; modelling; open systems; software maintenance; software standards; AI-ESTATE model editing; EXPRESS language; IEEE 1232; Java; LabVIEW; component based ATS; data interchange format; diagnostic information model; diagnostic reasoning; empirical assessments; fault tree information model; graphical representation layer; human factors; model editing component; models maintenance; morphological display algorithms; plug-n-play component; software COTS; topological display algorithms; Automatic testing; Context modeling; Displays; Human factors; Maintenance engineering; Software engineering; Software standards; Software testing; Standards development; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON Proceedings, 2001. IEEE Systems Readiness Technology Conference
Conference_Location :
Valley Forge, PA
ISSN :
1080-7225
Print_ISBN :
0-7803-7094-5
Type :
conf
DOI :
10.1109/AUTEST.2001.949452
Filename :
949452
Link To Document :
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