Title :
Integrated identification and control for diffusion/CVD furnaces
Author :
Tsakalis, Kostas ; Stoddard, Kevin
Author_Institution :
Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA
Abstract :
The paper describes an integrated approach for modeling and robust multivariable controller design, with application to temperature control of diffusion and CVD furnaces. The modeling relies on input-output data, collected in a preliminary identification experiment at the desired operating conditions. An important component of the identification is the computation of uncertainty bounds that describe the confidence limits of the model, in a manner consistent with robust control theory. The results of the identification are then used to design an H-infinity controller with a cascade, hierarchical structure. The final implementation of the controller also includes mechanisms to prevent integrator wind-up. Special emphasis is placed on automating the procedure-for classes of furnaces-so that, potentially, it can be used by nonexperts in the field. Implementations include several industrial furnaces. Experimental results demonstrate the success of the approach as well as a good agreement between predicted and actual closed-loop behavior
Keywords :
H∞ control; cascade control; chemical vapour deposition; control system synthesis; diffusion; furnaces; hierarchical systems; integrated circuit manufacture; multivariable control systems; process control; robust control; semiconductor process modelling; temperature control; uncertain systems; CVD furnaces; H-infinity controller; H∞ control; I/O data; cascade hierarchical structure; closed-loop behavior; diffusion furnaces; identification; industrial furnaces; input-output data; integrator wind-up; modeling; robust multivariable controller design; semiconductor manufacturing industry; temperature control; uncertainty bounds; Automatic control; Furnaces; Paper technology; Resistance heating; Robust control; System identification; Temperature control; Temperature dependence; Temperature distribution; Temperature measurement;
Conference_Titel :
Emerging Technologies and Factory Automation Proceedings, 1997. ETFA '97., 1997 6th International Conference on
Conference_Location :
Los Angeles, CA
Print_ISBN :
0-7803-4192-9
DOI :
10.1109/ETFA.1997.616324