Title :
Defect detection using power supply transient signal analysis
Author :
Germida, Amy ; Yan, Zheng ; Plusquellic, James F. ; Muradali, Fidel
Author_Institution :
Dept. of Comput. Sci. & Electr. Eng., Maryland Univ., Baltimore, MD, USA
Abstract :
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. The power supply transient signals of an 8-bit multiplier are analyzed using both hardware and simulation experiments. The small signal variations generated at these test points are analyzed in both the time and frequency domain. A simple statistical procedure is presented that captures the variation introduced by defects while attenuating those variations introduced by process variations. The results of the analysis show that it is possible to distinguish between defect-free and defective devices in both simulation and hardware
Keywords :
CMOS digital integrated circuits; automatic testing; electric current measurement; fault diagnosis; frequency-domain analysis; integrated circuit testing; logic testing; multiplying circuits; time-domain analysis; transient analysis; waveform analysis; CMOS devices; core logic test pads; decision criterion; defect detection; digital device testing method; frequency domain; multiple test points; multiplier; pass/fail linear regression analysis; power supply transient signal analysis; process variations; signature waveforms; simulation; small signal variations; time domain; voltage transients; Analytical models; Circuit simulation; Circuit testing; Hardware; Logic devices; Logic testing; Power supplies; Signal analysis; Signal processing; Transient analysis;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805615
