DocumentCode
3476494
Title
Maintenance data mining and visualization for fault trend analysis
Author
Wright, R. Glenn ; Kirkland, Larry V. ; Cicchiani, John ; Deng, Yong ; Dowd, Noah ; Hartmuller, Tricia ; Urchasko, Jason
fYear
2001
fDate
2001
Firstpage
808
Lastpage
815
Abstract
This paper describes research efforts currently underway to acquire and analyze test data to determine whether trends and other tendencies may exist that may be indicative of future circuit board failures and potential reduced weapon system readiness. We begin by citing that in today´s test environment using test program sets (TPSs) hosted on automatic test equipment (ATE), no provisions are made for capturing or analyzing Unit Under Test (UUT) data, on a large scale. The distributed resources used to perform UUT testing further complicate the situation,since no methodology currently exists that can demonstrate whether trends or events exist in the data that may be indicative of supportability, maintainability, or readiness problems. Our approach. is based upon fulfilling the need to recognize changes in the tolerance of equipment performance. This can be accomplished through the large-scale recording and analysis of test data that can aid in the performance of remote testing and recognition of tolerance changes and other issues that effect diagnostic ability. This would also facilitate taking appropriate corrective action to predict and/or compensate for such behavior before significant mission impact or failure occurs
Keywords
automatic test equipment; automatic testing; computer architecture; data mining; data visualisation; failure analysis; fault diagnosis; maintenance engineering; military systems; printed circuit testing; statistical analysis; weapons; ATE; TPS; UUT; Unit Under Test; circuit board failures; data mining; data visualization; distributed resources; fault analysis; large-scale recording; reduced weapon system readiness; statistical analysis; tolerance; tolerance changes; trend analysis; Automatic testing; Circuit faults; Circuit testing; Data analysis; Data mining; Data visualization; Failure analysis; Large-scale systems; Printed circuits; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON Proceedings, 2001. IEEE Systems Readiness Technology Conference
Conference_Location
Valley Forge, PA
ISSN
1080-7225
Print_ISBN
0-7803-7094-5
Type
conf
DOI
10.1109/AUTEST.2001.949463
Filename
949463
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