• DocumentCode
    3476494
  • Title

    Maintenance data mining and visualization for fault trend analysis

  • Author

    Wright, R. Glenn ; Kirkland, Larry V. ; Cicchiani, John ; Deng, Yong ; Dowd, Noah ; Hartmuller, Tricia ; Urchasko, Jason

  • fYear
    2001
  • fDate
    2001
  • Firstpage
    808
  • Lastpage
    815
  • Abstract
    This paper describes research efforts currently underway to acquire and analyze test data to determine whether trends and other tendencies may exist that may be indicative of future circuit board failures and potential reduced weapon system readiness. We begin by citing that in today´s test environment using test program sets (TPSs) hosted on automatic test equipment (ATE), no provisions are made for capturing or analyzing Unit Under Test (UUT) data, on a large scale. The distributed resources used to perform UUT testing further complicate the situation,since no methodology currently exists that can demonstrate whether trends or events exist in the data that may be indicative of supportability, maintainability, or readiness problems. Our approach. is based upon fulfilling the need to recognize changes in the tolerance of equipment performance. This can be accomplished through the large-scale recording and analysis of test data that can aid in the performance of remote testing and recognition of tolerance changes and other issues that effect diagnostic ability. This would also facilitate taking appropriate corrective action to predict and/or compensate for such behavior before significant mission impact or failure occurs
  • Keywords
    automatic test equipment; automatic testing; computer architecture; data mining; data visualisation; failure analysis; fault diagnosis; maintenance engineering; military systems; printed circuit testing; statistical analysis; weapons; ATE; TPS; UUT; Unit Under Test; circuit board failures; data mining; data visualization; distributed resources; fault analysis; large-scale recording; reduced weapon system readiness; statistical analysis; tolerance; tolerance changes; trend analysis; Automatic testing; Circuit faults; Circuit testing; Data analysis; Data mining; Data visualization; Failure analysis; Large-scale systems; Printed circuits; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON Proceedings, 2001. IEEE Systems Readiness Technology Conference
  • Conference_Location
    Valley Forge, PA
  • ISSN
    1080-7225
  • Print_ISBN
    0-7803-7094-5
  • Type

    conf

  • DOI
    10.1109/AUTEST.2001.949463
  • Filename
    949463