Title :
GOOFI-2: A tool for experimental dependability assessment
Author :
Skarin, Daniel ; Barbosa, Raul ; Karlsson, Lohan
Author_Institution :
Dept. of Comput. Sci. & Eng., Chalmers Univ. of Technol., Göteborg, Sweden
fDate :
June 28 2010-July 1 2010
Abstract :
This paper presents GOOFI-2, a comprehensive fault injection tool for experimental dependability assessment of embedded systems. The tool includes a large number of extensions and improvements over its predecessor, GOOFI. These include support for three widely used fault injection techniques, two target processors, and a variety of new features for storing, disseminating and analyzing experimental data. We report on our experiences and lessons learned from the use and development of GOOFI-2. In particular, we compare and discuss properties of three fault injection techniques: Nexus-based, exception-based and instrumentation-based injection. The comparison relies on several sets of experiments with two target processors, Freescale´s MPC565 and MPC5554.
Keywords :
embedded systems; fault tolerant computing; microcontrollers; program debugging; GOOFI-2 tool; MPC5554 processor; MPC565 processor; embedded systems; exception-based injection; experimental dependability assessment; fault injection techniques; instrumentation-based injection; nexus-based injection; Computer science; Data analysis; Debugging; Embedded system; Fault diagnosis; Fault tolerance; ISO standards; Instruments; Road safety; Testing;
Conference_Titel :
Dependable Systems and Networks (DSN), 2010 IEEE/IFIP International Conference on
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-7500-1
Electronic_ISBN :
978-1-4244-7499-8
DOI :
10.1109/DSN.2010.5544265
