GOOFI-2: A tool for experimental dependability assessment

This paper presents GOOFI-2, a comprehensive fault injection tool for experimental dependability assessment of embedded systems. The tool includes a large number of extensions and improvements over its predecessor, GOOFI. These include support for three widely used fault injection techniques, two target processors, and a variety of new features for storing, disseminating and analyzing experimental data. We report on our experiences and lessons learned from the use and development of GOOFI-2. In particular, we compare and discuss properties of three fault injection techniques: Nexus-based, exception-based and instrumentation-based injection. The comparison relies on several sets of experiments with two target processors, Freescale´s MPC565 and MPC5554.