DocumentCode :
3476515
Title :
On quality of test sets: relating fault coverage to defect coverage
Author :
D´souzat, A.L. ; Hsiao, Michael S.
Author_Institution :
Sun Microsystems, Sunnyvale, CA, USA
fYear :
2001
fDate :
2001
Firstpage :
816
Lastpage :
825
Abstract :
The true quality of a test set can be evaluated by estimating its coverage of arbitrary defects. In evaluating the quality of test sets, test vectors were generated from different test generators. We estimate the corresponding defect coverages for these test sets of varying lengths, generated by different test generators. The coverage estimation is performed using a region based model, in which it is independent of specific, physical, fault models. Experimental results show that similar fault coverages of varying test set sizes yield similar defect coverage. Further, similar activity and observability levels were observed in spite of the fact that test sets were generated with different methods and had different sizes
Keywords :
integrated circuit testing; activity level; defect coverage; fault coverage; fault model; observability level; region based model; test generator; test set quality; test vector generation; Automatic test pattern generation; Circuit faults; Circuit testing; Compaction; Contracts; Fault detection; Observability; Performance evaluation; Sun; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON Proceedings, 2001. IEEE Systems Readiness Technology Conference
Conference_Location :
Valley Forge, PA
ISSN :
1080-7225
Print_ISBN :
0-7803-7094-5
Type :
conf
DOI :
10.1109/AUTEST.2001.949464
Filename :
949464
Link To Document :
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