DocumentCode
347652
Title
Functional verification of intellectual properties (IP): a simulation-based solution for an application-specific instruction-set processor
Author
Stadler, Manfred ; Röwer, Thomas ; Kaeslin, Hubert ; Felber, Norbert ; Fichtner, Wolfgang ; Thalmann, Markus
Author_Institution
Integrated Syst. Lab., Swiss Fed. Inst. of Technol., Zurich, Switzerland
fYear
1999
fDate
1999
Firstpage
414
Lastpage
420
Abstract
Scalability and customization properties of IP modules demand for new approaches in functional verification. We present a novel simulation-based solution for an Application-specific Instruction-set Processor (ASIP). Existing assembler code preselected by IP-configurable constraints forms the verification data base (reference stimuli). A behavioral “golden model” of the IP is used to derive expected responses suitable for any possible configuration of the final ASIP (RTL) implementation. Cycle-based verification is performed by stimulating the RTL model with the assembled reference stimuli and by comparing the outputs (actual responses) against the expected responses. Primary input stimulation is accomplished by reading back interface data prior written to a memory (model) under control of the reference stimuli. The synchronization of the configaration-dependent actual responses to the non-cycle-related expected responses is achieved by a mechanism based on “interface-specific activity scheduling”, which further more reduces the number of vectors efficiently, resulting in a significant simulation speed-up
Keywords
application specific integrated circuits; automatic testing; circuit CAD; circuit simulation; computer architecture; integrated circuit design; microprocessor chips; processor scheduling; synchronisation; ASIP; CMOS; RTL model; application-specific instruction-set processor; back interface data; customization properties; cycle-based verification; eference stimuli; golden model; interface-specific activity scheduling; non-cycle-related expected responses; outputs; primary input stimulation; reference stimuli; responses; scalability; simulation speed-up; Application specific integrated circuits; Application specific processors; Circuit simulation; Circuit testing; Digital circuits; Intellectual property; Laboratories; Scalability; System-on-a-chip; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1999. Proceedings. International
Conference_Location
Atlantic City, NJ
ISSN
1089-3539
Print_ISBN
0-7803-5753-1
Type
conf
DOI
10.1109/TEST.1999.805763
Filename
805763
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