• DocumentCode
    347658
  • Title

    Analog Fault Simulation: Key to Product Quality, or a Foot in the Door

  • Author

    Force, Craig

  • Author_Institution
    Texas Instruments
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    650
  • Lastpage
    650
  • Keywords
    Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Context modeling; Electronic design automation and methodology; Foot; Logic design; Logic testing; Signal design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1999. Proceedings. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-5753-1
  • Type

    conf

  • DOI
    10.1109/TEST.1999.805791
  • Filename
    805791
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=347658