• DocumentCode
    347662
  • Title

    Relating linearity test results to design flaws of pipelined analog to digital converters

  • Author

    Kuyel, Turker ; Bilhan, Haydar

  • Author_Institution
    Texas Instrum. Inc., Dallas, TX, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    772
  • Lastpage
    779
  • Abstract
    This paper is an analysis of linearity errors inherent in pipelined analog to digital converter (ADC) architectures. We explain the architecture, demonstrate the error mechanisms affecting linearity test results, and compare the behavioral DC model linearity data to actual test data. Design and process shortcomings are illustrated in a “cause and effect” fashion. The goal is to help “design debug” by relating the ATE generated integral nonlinearity plots to actual design flaws of the converter
  • Keywords
    analogue-digital conversion; automatic testing; design for testability; error detection; integrated circuit testing; pipeline processing; ADC architecture; ATE generated; behavioral DC model; design debug; design flaws; error mechanisms; flash ADC; integral nonlinearity plots; linearity errors; linearity test results; pipelined A/D convertors; Analog-digital conversion; Energy consumption; Error analysis; Instruments; Linearity; Measurement; Process design; Resistors; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1999. Proceedings. International
  • Conference_Location
    Atlantic City, NJ
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-5753-1
  • Type

    conf

  • DOI
    10.1109/TEST.1999.805807
  • Filename
    805807