DocumentCode :
347662
Title :
Relating linearity test results to design flaws of pipelined analog to digital converters
Author :
Kuyel, Turker ; Bilhan, Haydar
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
fYear :
1999
fDate :
1999
Firstpage :
772
Lastpage :
779
Abstract :
This paper is an analysis of linearity errors inherent in pipelined analog to digital converter (ADC) architectures. We explain the architecture, demonstrate the error mechanisms affecting linearity test results, and compare the behavioral DC model linearity data to actual test data. Design and process shortcomings are illustrated in a “cause and effect” fashion. The goal is to help “design debug” by relating the ATE generated integral nonlinearity plots to actual design flaws of the converter
Keywords :
analogue-digital conversion; automatic testing; design for testability; error detection; integrated circuit testing; pipeline processing; ADC architecture; ATE generated; behavioral DC model; design debug; design flaws; error mechanisms; flash ADC; integral nonlinearity plots; linearity errors; linearity test results; pipelined A/D convertors; Analog-digital conversion; Energy consumption; Error analysis; Instruments; Linearity; Measurement; Process design; Resistors; Testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ
ISSN :
1089-3539
Print_ISBN :
0-7803-5753-1
Type :
conf
DOI :
10.1109/TEST.1999.805807
Filename :
805807
Link To Document :
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