DocumentCode
347662
Title
Relating linearity test results to design flaws of pipelined analog to digital converters
Author
Kuyel, Turker ; Bilhan, Haydar
Author_Institution
Texas Instrum. Inc., Dallas, TX, USA
fYear
1999
fDate
1999
Firstpage
772
Lastpage
779
Abstract
This paper is an analysis of linearity errors inherent in pipelined analog to digital converter (ADC) architectures. We explain the architecture, demonstrate the error mechanisms affecting linearity test results, and compare the behavioral DC model linearity data to actual test data. Design and process shortcomings are illustrated in a “cause and effect” fashion. The goal is to help “design debug” by relating the ATE generated integral nonlinearity plots to actual design flaws of the converter
Keywords
analogue-digital conversion; automatic testing; design for testability; error detection; integrated circuit testing; pipeline processing; ADC architecture; ATE generated; behavioral DC model; design debug; design flaws; error mechanisms; flash ADC; integral nonlinearity plots; linearity errors; linearity test results; pipelined A/D convertors; Analog-digital conversion; Energy consumption; Error analysis; Instruments; Linearity; Measurement; Process design; Resistors; Testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1999. Proceedings. International
Conference_Location
Atlantic City, NJ
ISSN
1089-3539
Print_ISBN
0-7803-5753-1
Type
conf
DOI
10.1109/TEST.1999.805807
Filename
805807
Link To Document