Title :
Replacing legacy digital test instrumentation
Author :
Hutchinson, J. Andrew ; Earley, David
Abstract :
The purpose of this paper is to examine the complexity of replacement of high performance digital instruments in aging test systems and the factors that affect the transition. Those factors include software integration and changes in basic functionality and in parametric performance. To demonstrate the transition, three instrument replacements are described where the process is broken down by the requirements, efforts, obstacles and countermeasures involved in engineering a solution
Keywords :
automatic test equipment; automatic test software; digital instrumentation; aging test systems; digital instrument replacement; digital instruments; functionality; instrument replacements; legacy digital test instrumentation; parametric performance; software integration; Aging; Circuit testing; Electronic countermeasures; Electronic equipment testing; Electronics industry; Instruments; Investments; Life testing; Software performance; System testing;
Conference_Titel :
AUTOTESTCON Proceedings, 2001. IEEE Systems Readiness Technology Conference
Conference_Location :
Valley Forge, PA
Print_ISBN :
0-7803-7094-5
DOI :
10.1109/AUTEST.2001.949470
