• DocumentCode
    3476772
  • Title

    Advances in the measurement of the 28Si lattice parameter

  • Author

    Massa, E. ; Mana, G. ; Kessler, E.G.

  • Author_Institution
    INRIM - Ist. Naz. di Ricerca Metrologica, Torino, Italy
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    133
  • Lastpage
    134
  • Abstract
    This paper reports about the results of lattice parameter measurements aimed at determining the Avogadro constant by counting the atoms in enriched 28Si spheres.
  • Keywords
    lattice constants; light interferometry; silicon; 28Si; Avogadro constant; lattice parameter measurement; Atomic measurements; Crystals; Electromagnetic measurements; Lattices; NIST; Optical interferometry; Optical refraction; Optical variables control; Silicon; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements (CPEM), 2010 Conference on
  • Conference_Location
    Daejeon
  • Print_ISBN
    978-1-4244-6795-2
  • Type

    conf

  • DOI
    10.1109/CPEM.2010.5544280
  • Filename
    5544280
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3476772