• DocumentCode
    3476937
  • Title

    Experimental validation of a fault tolerant microcomputer system against intermittent faults

  • Author

    Gracia-Moran, J. ; Gil-Tomas, D. ; Saiz-Adalid, L.J. ; Baraza, J.C. ; Gil-Vicente, P.J.

  • Author_Institution
    Grupo de Sist. Tolerantes a Fallos (GSTF), Univ. Politec. de Valencia, Valencia, Spain
  • fYear
    2010
  • fDate
    June 28 2010-July 1 2010
  • Firstpage
    413
  • Lastpage
    418
  • Abstract
    As technologies shrink, new kinds of faults arise. Intermittent faults are part of these new faults. They are expected to be an increasing challenge in modern VLSI circuits. Up to now, transient and permanent faults used to be injected for the experimental validation of fault tolerance mechanisms. The main objective of this work is to improve the dependability assessment by injecting also intermittent faults. Furthermore, we have compared intermittent faults impact with the influence of transient and permanent faults. To carry out this study, we have injected bursts of intermittent faults in a fault-tolerant microcomputer system with some well known fault detection and recovery mechanisms. The methodology used lies in VHDL-Based Fault Injection technique, which allows a systematic and exhaustive analysis. Results show that intermittent faults have a notable impact on recovery mechanisms. They must be taken into account besides permanent and transient faults to implement an accurate dependability assessment.
  • Keywords
    VLSI; fault tolerant computing; hardware description languages; microcomputers; program verification; VHDL based fault injection technique; VLSI circuits; dependability assessment; experimental validation; fault tolerant microcomputer system; intermittent faults; Circuit faults; Computational modeling; Fault detection; Fault tolerance; Fault tolerant systems; Manufacturing processes; Microcomputers; Temperature; Very large scale integration; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Systems and Networks (DSN), 2010 IEEE/IFIP International Conference on
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    978-1-4244-7500-1
  • Electronic_ISBN
    978-1-4244-7499-8
  • Type

    conf

  • DOI
    10.1109/DSN.2010.5544288
  • Filename
    5544288