DocumentCode
3476937
Title
Experimental validation of a fault tolerant microcomputer system against intermittent faults
Author
Gracia-Moran, J. ; Gil-Tomas, D. ; Saiz-Adalid, L.J. ; Baraza, J.C. ; Gil-Vicente, P.J.
Author_Institution
Grupo de Sist. Tolerantes a Fallos (GSTF), Univ. Politec. de Valencia, Valencia, Spain
fYear
2010
fDate
June 28 2010-July 1 2010
Firstpage
413
Lastpage
418
Abstract
As technologies shrink, new kinds of faults arise. Intermittent faults are part of these new faults. They are expected to be an increasing challenge in modern VLSI circuits. Up to now, transient and permanent faults used to be injected for the experimental validation of fault tolerance mechanisms. The main objective of this work is to improve the dependability assessment by injecting also intermittent faults. Furthermore, we have compared intermittent faults impact with the influence of transient and permanent faults. To carry out this study, we have injected bursts of intermittent faults in a fault-tolerant microcomputer system with some well known fault detection and recovery mechanisms. The methodology used lies in VHDL-Based Fault Injection technique, which allows a systematic and exhaustive analysis. Results show that intermittent faults have a notable impact on recovery mechanisms. They must be taken into account besides permanent and transient faults to implement an accurate dependability assessment.
Keywords
VLSI; fault tolerant computing; hardware description languages; microcomputers; program verification; VHDL based fault injection technique; VLSI circuits; dependability assessment; experimental validation; fault tolerant microcomputer system; intermittent faults; Circuit faults; Computational modeling; Fault detection; Fault tolerance; Fault tolerant systems; Manufacturing processes; Microcomputers; Temperature; Very large scale integration; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Dependable Systems and Networks (DSN), 2010 IEEE/IFIP International Conference on
Conference_Location
Chicago, IL
Print_ISBN
978-1-4244-7500-1
Electronic_ISBN
978-1-4244-7499-8
Type
conf
DOI
10.1109/DSN.2010.5544288
Filename
5544288
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