DocumentCode :
3477029
Title :
CTE difference decrease of epoxy molding compound after molding and after PMC
Author :
Hongjie Liu ; Wei Tan ; Lanxia Li ; Xingming Cheng ; Jianglong Han
Author_Institution :
Econ. & Technol. Dev. Zone, Jiangsu Hua Hai Cheng Ke Adv. Mater. Co. Ltd., Lianyungang, China
fYear :
2013
fDate :
11-14 Aug. 2013
Firstpage :
139
Lastpage :
142
Abstract :
With the rapid development of the semiconductor filed, more and more advanced package types have turned up such as Quad Flat No-lead (QFN), Ball Grill Array (BGA), and so on to meet the requirement of the high O/I function. Followed on, warpage has emerged as a big challenge during cutting and surface mounting process. As packing material, Epoxy molding compound (EMC) often show different performance on warpage after molding and after post mold cure (PMC). Coefficient of thermal expansion (CTE) difference of epoxy molding compound and laminate is one of the key factors influencing warpage. Here an internal method to measure the warpage based on CTE of EMC after molding and after PMC using thermal mechanical analysis (TMA) equipment has been developed. Dynamic Mechanical Analyzer (DMA) and impact strength have also been introduced to indicating the toughness of EMC. Coupling agent, rubber A and rubber B, polymer elastomer C and silicon oil D, have been investigated in the EMC system. The result show that EMC without coupling agent exhibits minimum change of TMA plot after molding and after PMC, meanwhile its DMA data displayed lowest modulus at room temperature, molding temperature as well as reflow temperature in the testing system. At the same time, EMC with rubber A show the biggest mold shringkage change after molding and after PMC. EMC with polymer elastomer C and EMC with silicon oil D show highest impact strength.
Keywords :
curing; electronics packaging; laminates; surface mount technology; thermal expansion; BGA; QFN; ball grill array; coupling agent; cutting process; dynamic mechanical analyzer; epoxy molding compound; laminate; packing material; post mold cure; quad flat no-lead; surface mounting process; thermal expansion coefficient; thermal mechanical analysis; Compounds; Couplings; Electromagnetic compatibility; Electronics packaging; Instruments; Rubber; Silicon; CTE difference; EMC; TMA; warpage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology (ICEPT), 2013 14th International Conference on
Conference_Location :
Dalian
Type :
conf
DOI :
10.1109/ICEPT.2013.6756441
Filename :
6756441
Link To Document :
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