• DocumentCode
    3477055
  • Title

    Doubly-expedited one-step Byzantine consensus

  • Author

    Banu, Nazreen ; Izumi, Taisuke ; Wada, Koichi

  • Author_Institution
    Grad. Sch. of Eng., Nagoya Inst. of Technol., Nagoya, Japan
  • fYear
    2010
  • fDate
    June 28 2010-July 1 2010
  • Firstpage
    373
  • Lastpage
    382
  • Abstract
    It is known that Byzantine consensus algorithms guarantee one-step decision only in favorable situations (e.g. when all processes propose the same value) and no one-step algorithm can support two-step decision. This paper presents DEX, a novel one-step Byzantine algorithm that circumvents these impossibilities using the condition-based approach. Algorithm DEX has two distinguished features: Adaptiveness and Double-expedition property. Adaptiveness makes it sensitive to only actual number of failures so that it provides fast termination for more number of inputs when there are fewer failures (a common case in practice). The double-expedition property facilitates two-step decision in addition to one-step decision by running two condition-based mechanisms in parallel. To the best of our knowledge, double-expedition property is the new concept introduced by this paper, and DEX is the first algorithm having such a feature. Although DEX takes four steps at worst in well-behaved runs while existing one-step algorithms take only three, it is expected to work efficiently because the worst-case does not occur so often in practice.
  • Keywords
    distributed algorithms; fault tolerant computing; Byzantine consensus algorithm; DEX algorithm; condition-based approach; double-expedition property; one-step decision; two-step decision; Broadcasting; Computer crashes; Detectors; Educational institutions; Fault tolerant systems; Magnetic heads; Mechanical factors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Systems and Networks (DSN), 2010 IEEE/IFIP International Conference on
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    978-1-4244-7500-1
  • Electronic_ISBN
    978-1-4244-7499-8
  • Type

    conf

  • DOI
    10.1109/DSN.2010.5544293
  • Filename
    5544293