Title :
A High Throughput Multiplier Design Exploiting Input Based Statistical Distribution in Completion Delays
Author :
Uppu, Ravi Tej ; Uppu, Ravi Kanth ; Singh, Adit D. ; Chatterjee, Avhishek
Author_Institution :
Dept. of Electr. & Comput. Eng., Auburn Univ., Auburn, AL, USA
Abstract :
Design methodologies such as Razor minimize power dissipation by slowing down circuits so as to eliminate timing slacks to the point where occasional timing errors are observed. The main challenge here is the design of efficient mechanisms to detect and recover from these infrequent errors without loss of functionality. We present a design for widely used Wallace multipliers where, because of the highly skewed input based statistical distribution in completion delays, the potential for power and performance gains is significantly higher. Clock periods can be potentially reduced by a factor of 2 or more, with very rare timing errors for random input distributions. For error recovery we present a novel approach that latches and holds logic values at key internal circuit nodes during every clock cycle beyond the next clock edge. This allows generation of the correct outputs for that clock period one clock cycle later in case of a timing error. Meanwhile, very fast error evaluation, exploiting a unique characteristic of carry ripple addition, allows this hold to be quickly released if an error is not detected, ensuring no impact on the circuit timing in error free operation. Our approach is shown to deliver comparable performance to the fastest multipliers at substantially reduced power and hardware costs.
Keywords :
logic design; multiplying circuits; statistical distributions; Razor; Wallace multipliers; carry ripple addition; circuit timing; clock cycle; clock edge; clock periods; completion delays; design methodologies; error free operation; error recovery; high throughput multiplier design; highly skewed input based statistical distribution; internal circuit nodes; logic values; performance gains; power dissipation; power gains; timing errors; timing slacks; Adders; Clocks; Delay; Latches; Logic gates; Registers; Clock Period Scaling; Completion Sensing; Delay Distribution; Hold Latch; Wallace Multiplier;
Conference_Titel :
VLSI Design and 2013 12th International Conference on Embedded Systems (VLSID), 2013 26th International Conference on
Conference_Location :
Pune
Print_ISBN :
978-1-4673-4639-9
DOI :
10.1109/VLSID.2013.172