• DocumentCode
    3477181
  • Title

    Image deconvolution by stein block thresholding

  • Author

    Chesneau, C. ; Fadili, M.J. ; Starck, J.L.

  • Author_Institution
    Lab. de Math. Nicolas Oresme, Univ. de Caen, Caen, France
  • fYear
    2009
  • fDate
    7-10 Nov. 2009
  • Firstpage
    1329
  • Lastpage
    1332
  • Abstract
    In this paper, we propose a fast image deconvolution algorithm that combines adaptive block thresholding and Vaguelet-Wavelet Decomposition. The approach consists in first denoising the observed image using a wavelet-domain Stein block thresholding, and then inverting the convolution operator in the Fourier domain. Our main theoretical result investigates the minimax rates over Besov smoothness spaces, and shows that our block estimator can achieve the optimal minimax rate, or is at least nearly-minimax in the least favorable situation. The resulting algorithm is simple to implement and fast. Its computational complexity is dominated by that of the FFT in the Fourier-domain inversion step. We report a simulation study to support our theoretical findings. The practical performance of our block vaguelet-wavelet deconvolution compares very favorably to existing competitors on a large set of test images.
  • Keywords
    computational complexity; deconvolution; image denoising; image segmentation; wavelet transforms; Besov smoothness spaces; Fourier domain; Stein block thresholding; computational complexity; convolution operator; image deconvolution; image denoising; vaguelet wavelet decomposition; Bayesian methods; Convolution; Deconvolution; Inverse problems; Iterative algorithms; Minimax techniques; Mirrors; Noise reduction; Wavelet coefficients; Wavelet domain; Block thresholding; Image deconvolution; Minimax; Wavelets;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2009 16th IEEE International Conference on
  • Conference_Location
    Cairo
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-5653-6
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2009.5413572
  • Filename
    5413572