• DocumentCode
    3477301
  • Title

    Research on 0.6 mil Ag-8Au-3Pd alloy wire bonding process

  • Author

    Cheng Yin ; Rui Guo ; Ming Li ; Xiao, Jun ; Lv, Eric ; Chiu, Huang-Jen

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Shanghai Jiao Tong Univ., Shanghai, China
  • fYear
    2013
  • fDate
    11-14 Aug. 2013
  • Firstpage
    200
  • Lastpage
    204
  • Abstract
    Ag-8Au-3Pd alloy wire has shown its advantages as a kind of interconnect material in semiconductor packaging. In thermosonic wire bonding, a uniformed and stable Free-Air-Ball (FAB) created by electronic flame-off (EFO) is crucial to a reliable 1st bond. In this study, the relationship between Free-Air-Ball (FAB) size and EFO parameters (EFO current, EFO time) of 0.6 mil Ag-8Au-3Pd alloy wire has been investigated. According to the FAB formation curve of 0.6 mil Ag-8Au-3Pd alloy wire, a suitable EFO parameter was settled down, then a design of experiment (DOE) was set up to investigate the optimum parameter window. As expected, the experiment results illustrate that 0.6 mil Ag-8Au-3Pd alloy wire is workable as the interconnect material with less cost.
  • Keywords
    electronics packaging; gold alloys; interconnections; lead bonding; palladium alloys; silver alloys; solders; Ag-Au-Pd; DOE; EFO; FAB size; design of experiment; electronic flame-off; free-air-ball; interconnect material; optimum parameter window; semiconductor packaging; size 0.6 mil; thermosonic wire bonding process; wire bonding process; Bonding; Copper; Gold; Materials; Packaging; Wires; Ag-8Au-3Pd; Free-Air-Ball; Process window; Wire bonding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology (ICEPT), 2013 14th International Conference on
  • Conference_Location
    Dalian
  • Type

    conf

  • DOI
    10.1109/ICEPT.2013.6756453
  • Filename
    6756453